TESTING APPARATUS FOR ELECTRONIC DEVICE

摘要

A testing apparatus to establish a fault by a process of elimination includes an input unit, a signal converting unit, a switch unit, and a display unit. The input unit receives an input signal and outputs a switch signal. The signal converting unit receives the switch signal and outputs a control signal. The switch unit receives the control signal and outputs a test signal. The display unit receives the test signal and runs a built in self test (BIST) program to test the proper functioning of the display unit. The signal converting unit outputs a data signal and a clock signal to the display unit when the display unit works normally. The signal converting unit not output the data signal and the clock signal to the display unit when the input signal and resulting control signal are repeated.

主权项

1. A testing apparatus comprising:
an input unit configured to receive an input signal and to output a switch signal; a signal converting unit configured to receive the switch signal and to output a control signal; a switch unit configured to receive the control signal and to output a test signal; and a display unit configured to receive the test signal and run a built in self test (BIST) program to test the display unit, wherein the signal converting unit is configured to output a data signal and a clock signal to the display unit when the display unit works normally, and wherein the signal converting unit is configured to not output the data signal and the clock signal to the display unit when the display unit is tested according to the switch signal.