发明名称 |
POLARIZATION PROPERTIES IMAGING SYSTEMS |
摘要 |
This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment. |
申请公布号 |
US2016116397(A1) |
申请公布日期 |
2016.04.28 |
申请号 |
US201414893157 |
申请日期 |
2014.05.20 |
申请人 |
HINDS INSTRUMENTS, INC. |
发明人 |
Freudenthal John;Leadbetter Andy;Wang Baoliang |
分类号 |
G01N21/23 |
主分类号 |
G01N21/23 |
代理机构 |
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代理人 |
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主权项 |
1. A method of simultaneous imaging in-plane and out-of-plane birefringence properties of a sample over a wide range of incidence angles, comprising:
directing a plurality of polarization-modulated light rays to a sample location such that each ray has a specific angle of incidence such that the plurality of rays defines a plurality of incidence angles relative to the sample; redirecting each of the light rays that pass through the sample to separate pixels of an imaging device so that the intensity characteristics of each ray can be detected; gating the imaging device using as a trigger signal a frequency-synthesized waveform corresponding to the polarization modulation that is applied to the light rays; and simultaneously detecting birefringence properties of the sample associated with each of the redirected light rays. |
地址 |
Hillsboro OR US |