COMPONENT MEASUREMENT SYSTEM HAVING WAVELENGTH FILTERING

摘要

A system is disclosed for measuring a feature of a component. The system may have a probe with a tip, and a sensing element configured to generate signals associated with a proximity of the tip to the feature. The system may also have an actuator configured to move the probe relative to the component, and a controller in communication with the sensing element and the actuator. The controller may be configured to generate a deviation report based on the signals, and to filter information from the deviation report according to wavelength into a plurality of deviation categories corresponding to specification requirements of the component. The plurality of deviation categories may include at least a waviness category. The controller may also be configured to determine a change to a process used to fabricate the component based on the information from the deviation report filtered into the waviness category.

主权项

1. A system for measuring a feature of a component, comprising:
a probe having a tip, and a sensing element configured to generate signals associated with proximity of the tip to the feature; an actuator configured to move the probe relative to the component; and a controller in communication with the sensing element and the actuator, the controller being configured to:
generate a deviation report based on the signals;filter information from the deviation report according to wavelength into a plurality of deviation categories corresponding to specification requirements of the component, the plurality of deviation categories including at least a waviness category; anddetermine a change to a process used to fabricate the component based on the information from the deviation report filtered into the waviness category.