发明名称 FAILURE PREDICTION APPARATUS AND FAILURE PREDICTION SYSTEM
摘要 A failure prediction apparatus includes an acquisition unit that acquires, from plural apparatuses to be monitored, state feature amount groups, a classification unit that classifies the plural apparatuses to be monitored for each degree of separation between a reference space which is defined by the plural state feature amount groups acquired by the acquisition unit and the state feature amount group of each of the plural apparatuses to be monitored, and a calculation unit that specifies a class which is classified by the classification unit and corresponds to the degree of separation between the reference space and the state feature amount group of an apparatus to be monitored and subjected to a failure prediction process among the plural apparatuses to be monitored, and calculates a probability of a failure occurring in the apparatus to be monitored and subjected to the failure prediction process.
申请公布号 US2016116377(A1) 申请公布日期 2016.04.28
申请号 US201514707412 申请日期 2015.05.08
申请人 FUJI XEROX CO., LTD. 发明人 UWATOKO Koki
分类号 G01M99/00;G06F17/18 主分类号 G01M99/00
代理机构 代理人
主权项 1. A failure prediction apparatus comprising: an acquisition unit that acquires, from a plurality of apparatuses to be monitored, state feature amount groups which are a plurality of state feature amounts indicating features of an operating state of the apparatuses to be monitored; a classification unit that classifies the plurality of apparatuses to be monitored for each degree of separation between a reference space which is defined by the plurality of state feature amount groups acquired by the acquisition unit and the state feature amount group of each of the plurality of apparatuses to be monitored; and a calculation unit that specifies a class which is classified by the classification unit and corresponds to the degree of separation between the reference space and the state feature amount group of an apparatus to be monitored and subjected to a failure prediction process acquired by the acquisition unit for a predetermined period among the plurality of apparatuses to be monitored, and calculates a probability of a failure occurring in the apparatus to be monitored and subjected to the failure prediction process, using the state feature amount group related to the apparatus to be monitor included in the class.
地址 Tokyo JP