发明名称 CMOS Integrated Moving-Gate Transducer with Silicon as a Functional Layer
摘要 A method of fabricating a semiconductor device comprises forming a dielectric layer above a substrate, the dielectric layer including a fixed dielectric portion and a proof mass portion, forming a source region and a drain region in the substrate, forming a gate electrode in the proof mass portion, and releasing the proof mass portion, such that the proof mass portion is movable with respect to the fixed dielectric portion and the gate electrode is movable with the proof mass portion relative to the source region and the drain region.
申请公布号 US2016115013(A1) 申请公布日期 2016.04.28
申请号 US201614988842 申请日期 2016.01.06
申请人 Robert Bosch GmbH 发明人 Feyh Ando;Chen Po-Jui;Ulm Markus
分类号 B81B3/00;B81C1/00 主分类号 B81B3/00
代理机构 代理人
主权项 1. A method of fabricating a semiconductor device, comprising: forming a dielectric layer above a substrate, the dielectric layer including a fixed dielectric portion and a proof mass portion; forming a source region and a drain region in the substrate; forming a gate electrode in the proof mass portion; and releasing the proof mass portion, such that the proof mass portion is movable with respect to the fixed dielectric portion and the gate electrode is movable with the proof mass portion relative to the source region and the drain region.
地址 Stuttgart DE