发明名称 METHOD AND DEVICE FOR DETERMINING ERROR VECTOR MAGNITUDE SERIES PARAMETER
摘要 Disclosed are a method and a device for determining an Error Vector Magnitude (EVM) series parameter. The method includes: acquiring a measurement signal; normalizing the measurement signal according to a power to obtain a normalized measurement signal; carrying out calculation according to the normalized measurement signal and an ideal signal to obtain an EVM; carrying out calculation according to the normalized measurement signal to obtain an IQ offset; eliminating the IQ offset to obtain an eliminated IQ offset measurement signal; carrying out calculation according to the eliminated IQ offset measurement signal to obtain an IQ gain imbalance; and carrying out calculation according to the eliminated IQ offset measurement signal to obtain a quadrature phase error.
申请公布号 WO2016061975(A1) 申请公布日期 2016.04.28
申请号 WO2015CN74046 申请日期 2015.03.11
申请人 ZTE CORPORATION 发明人 SHEN, BAILIN;WU, CHENGBIN
分类号 H04B10/07 主分类号 H04B10/07
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