发明名称 |
HIGH DEFINITION HEATER AND METHOD OF OPERATION |
摘要 |
An apparatus is provided, by way of example, a heater for use in semiconductor processing equipment, that includes a base functional layer having at least one functional zone. A substrate is secured to the base functional layer, and a tuning layer is secured to the substrate opposite the base functional layer. The tuning layer includes a plurality of zones that is greater in number than the zones of the base functional layer, and the tuning layer has lower power than the base functional layer. Further, a component, such as a chuck by way of example, is secured to the tuning layer opposite the substrate. The substrate defines a thermal conductivity to dissipate a requisite amount of power from the base functional layer. |
申请公布号 |
US2016118276(A1) |
申请公布日期 |
2016.04.28 |
申请号 |
US201614990109 |
申请日期 |
2016.01.07 |
申请人 |
Watlow Electric Manufacturing Company |
发明人 |
Ptasienski Kevin;Smith Kevin Robert;Swanson Cal Thomas;Schmidt Philip Steven;Nosrati Mohammad;Lindley Jacob;Boldt Allen Norman;Zhang Sanhong;Steinhauser Louis P.;Grimard Dennis Stanley |
分类号 |
H01L21/67 |
主分类号 |
H01L21/67 |
代理机构 |
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代理人 |
|
主权项 |
1. An apparatus comprising:
a base functional layer comprising at least one functional zone; a substrate secured to the base functional layer; a tuning layer secured to the substrate opposite the base functional layer, the tuning layer comprising a plurality of zones that is greater in number than the zones of the base functional layer, and the tuning layer providing lower power than the base functional layer; and a component secured to the tuning layer opposite the substrate, wherein the substrate defines a thermal conductivity to dissipate power from the base functional layer. |
地址 |
St. Louis MO US |