发明名称 HIGH DEFINITION HEATER AND METHOD OF OPERATION
摘要 An apparatus is provided, by way of example, a heater for use in semiconductor processing equipment, that includes a base functional layer having at least one functional zone. A substrate is secured to the base functional layer, and a tuning layer is secured to the substrate opposite the base functional layer. The tuning layer includes a plurality of zones that is greater in number than the zones of the base functional layer, and the tuning layer has lower power than the base functional layer. Further, a component, such as a chuck by way of example, is secured to the tuning layer opposite the substrate. The substrate defines a thermal conductivity to dissipate a requisite amount of power from the base functional layer.
申请公布号 US2016118276(A1) 申请公布日期 2016.04.28
申请号 US201614990109 申请日期 2016.01.07
申请人 Watlow Electric Manufacturing Company 发明人 Ptasienski Kevin;Smith Kevin Robert;Swanson Cal Thomas;Schmidt Philip Steven;Nosrati Mohammad;Lindley Jacob;Boldt Allen Norman;Zhang Sanhong;Steinhauser Louis P.;Grimard Dennis Stanley
分类号 H01L21/67 主分类号 H01L21/67
代理机构 代理人
主权项 1. An apparatus comprising: a base functional layer comprising at least one functional zone; a substrate secured to the base functional layer; a tuning layer secured to the substrate opposite the base functional layer, the tuning layer comprising a plurality of zones that is greater in number than the zones of the base functional layer, and the tuning layer providing lower power than the base functional layer; and a component secured to the tuning layer opposite the substrate, wherein the substrate defines a thermal conductivity to dissipate power from the base functional layer.
地址 St. Louis MO US