发明名称 Contamination Filter for Mass Spectrometer
摘要 Methods and systems for performing mass spectrometry are provided herein. In accordance with various aspects of the applicants' teachings, the methods and systems can utilize an ion mobility spectrometer operating at atmospheric or low-vacuum pressure to remove the major contributors to the contamination and degradation of critical downstream components of a mass spectrometer located within a high-vacuum system (e.g., ion optics, mass filters, detectors), with limited signal loss.
申请公布号 US2016118234(A1) 申请公布日期 2016.04.28
申请号 US201414894494 申请日期 2014.06.20
申请人 DH TECHNOLOGIES DEVELOPMENT PTE. LTD. 发明人 Covey Thomas R.;Schneider Bradley B.
分类号 H01J49/00;G01N27/62 主分类号 H01J49/00
代理机构 代理人
主权项 1. A method of operating a mass spectrometer system, the method comprising: providing anion source for ionizing a sample to generate a plurality of ions; providing a low resolution, high transmission ion mobility spectrometer for reducing contamination; introducing said plurality of ions into an input end of the ion mobility spectrometer; transporting said plurality of ions in a drift gas through the ion mobility spectrometer from the input end to an output end thereof; providing a mass spectrometer in fluid communication with the differential mobility spectrometer for receiving the ions from the output end of differential mobility spectrometer; and a ratio of the residence time of the ions through the ion mobility spectrometer to the product of gap height between electrodes of the ion mobility spectrometer and the maximum separation voltage applied to the electrodes of the ion mobility spectrometer being less than 0.002.
地址 Singapore SG