发明名称 PULSE SHAPE CHANGE FOR INTERFACE DETERMINATION
摘要 A method of pulsed radar interface determination for a first and second material in a tank. An interface level determination model is provided including a transfer function that utilizes refractive indices for the materials and thickness of the second material. At least one actual radar pulse is transmitted into the tank and a resulting echo curve portion including a measured interface pulse(s) around the interface location is measured. The interface model is simulated with a reference pulse and an initial thickness value to generate an initial model generated interface pulse (initial MGIP). The measured interface pulse is compared to the initial MGIP pulse point-by-point to determine residuals. If the residuals sum >a predetermined threshold, the comparing is repeated with an updated interface model generated with an updated thickness value that provides an updated MGIP pulse. When the sum of residuals is ≦predetermined threshold, the thickness is determined.
申请公布号 US2016117426(A1) 申请公布日期 2016.04.28
申请号 US201514880383 申请日期 2015.10.12
申请人 Honeywell International Inc. 发明人 SAVARD STEPHANE;HARAN FRANK MARTIN
分类号 G06F17/50;G06F17/16 主分类号 G06F17/50
代理机构 代理人
主权项 1. A method of pulsed radar interface determination, comprising: providing refractive indices for a first material and a second material in a tank, said second material being less dense as compared to said first material and forming an interface with said first material, and an interface level determination model (interface model) including a transfer function that utilizes said refractive indices and a thickness of said second material as parameters; transmitting at least one actual radar pulse into said tank and measuring a resulting echo curve or echo curve portion including at least one measured interface pulse around a location of said interface; simulating using said interface model run by a processor with a reference pulse as an input along with an initial value for said thickness to generate an initial model generated interface pulse (initial MGIP); comparing said measured interface pulse to said initial MGIP point-by-point over a plurality of points to determine a plurality of residuals; wherein if a sum of said residuals (sum of residuals) is >a predetermined threshold, iterating by repeating said comparing with an updated interface model generated from said interface model updated with an updated value for said thickness that provides an updated MGIP; and wherein when said sum of residuals is ≦said predetermined threshold, determining said thickness.
地址 Morris Plains NJ US