发明名称 APPARATUS AND METHOD FOR JOINT REFLECTANCE AND FLUORESCENCE SPECTRA ESTIMATION
摘要 Embodiments are directed to apparatuses and methods that jointly estimate reflectance and fluorescence spectra. An example embodiment includes providing captured intensity characteristics indicative of a target, the intensity characteristics acquired by illuminating the target with different illuminants and passing light in different spectral bands via a photodetector apparatus and providing reflectance properties and fluorescent properties of the target. The example embodiment further includes concurrently adjusting the reflectance properties and fluorescence properties to reduce a quantity indicative of a combination of: a difference between the captured intensity characteristics and intensities predicted using an image formation model incorporating the reflectance properties and fluorescence properties, functions of the reflectance properties, and functions of the fluorescence properties.
申请公布号 US2016116410(A1) 申请公布日期 2016.04.28
申请号 US201514921907 申请日期 2015.10.23
申请人 The Board of Trustees of the Leland Stanford Junior University 发明人 Blasinski Henryk;Wandell Brian A.;Farrell Joyce E.
分类号 G01N21/64;G01N21/31;G01N21/55 主分类号 G01N21/64
代理机构 代理人
主权项 1. A method comprising: providing captured intensity characteristics indicative of a target, the intensity characteristics acquired by illuminating the target with different illuminants and passing light in different spectral bands via a photodetector apparatus; providing reflectance properties and fluorescent properties of the target; concurrently adjusting the reflectance properties and fluorescence properties to reduce a quantity indicative of a combination of: a difference between the captured intensity characteristics and intensities predicted using an image formation model incorporating the reflectance properties and fluorescence properties;functions of the reflectance properties; andfunctions of the fluorescence properties; and outputting a reflectance spectra estimation and a fluorescent spectra estimation for the fluorophore based on the adjusted reflectance properties and fluorescence properties.
地址 Stanford CA US