发明名称 抵抗変化メモリ
摘要 According to one embodiment, a resistance-change memory includes a memory cell and a control circuit. The memory cell includes a first electrode, a second electrode, and a variable resistance layer which is disposed between the first electrode and the second electrode. The control circuit sets a current flowing through the memory cell to a first upper limit and applies a first voltage to the memory cell in a first write, and after the first write, the control circuit sets the current flowing through the memory cell to a second upper limit and applies a second voltage to the memory cell in a second write.
申请公布号 JP5911814(B2) 申请公布日期 2016.04.27
申请号 JP20130018645 申请日期 2013.02.01
申请人 株式会社東芝 发明人 杉前 紀久子;市原 玲華;林 哲也
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
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