发明名称 X-RAY EXAMINATION APPARATUS
摘要 An X-ray examination apparatus (10) comprises radiation modules in the form of an X-ray source (20) and an X-ray detector(18), a main curved arm (12) having opposite end sections (S1, S2) and a first auxiliary arm (14) provided at one end section (S1) of the main arm. The first auxiliary arm carries one radiation module (18) and another radiation module (20) is coupled to the other end section of the main arm. The first auxiliary arm has a shape that complements the curvature of the main curved arm at least at the first end section and is movable with respect to this end section at least in a direction away from it. In this way a wide range of inspection angles as well as a good patient coverage is achieved without limiting the rotational freedom of the apparatus.
申请公布号 EP1926432(B1) 申请公布日期 2016.04.27
申请号 EP20060795959 申请日期 2006.09.08
申请人 KONINKLIJKE PHILIPS N.V. 发明人 TIMMERMANS, ROGER, A., M.;LAFARRE, RAYMOND, W., L.
分类号 A61B6/00 主分类号 A61B6/00
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