发明名称 半導体装置の作製方法
摘要 It is an object to provide a semiconductor device including an oxide semiconductor, in which miniaturization of a transistor is achieved and the concentration of an electric field is relieved. The width of a gate electrode is reduced and a space between a source electrode layer and a drain electrode layer is shortened. By adding a rare gas in a self-alignment manner with the use of a gate electrode as a mask, a low-resistance region in contact with a channel formation region can be provided in an oxide semiconductor layer. Accordingly, even when the width of the gate electrode, that is, the line width of a gate wiring is small, the low-resistance region can be provided with high positional accuracy, so that miniaturization of a transistor can be realized.
申请公布号 JP5911533(B2) 申请公布日期 2016.04.27
申请号 JP20140146702 申请日期 2014.07.17
申请人 株式会社半導体エネルギー研究所 发明人 秋元 健吾;渡邊 了介;津吹 将志;山崎 舜平
分类号 H01L21/336;G02F1/1368;H01L21/8242;H01L27/108;H01L29/786 主分类号 H01L21/336
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