| 摘要 |
The present invention relates to a handler for testing a semiconductor device used in testing a manufactured semiconductor device. The handler for testing a semiconductor device according to the present invention includes a horizontal control part or/and a position control part which is automatically operated. According to the present invention, the horizontal state of the handler is automatically controlled by the horizontal control part. Movement performance is improved by the position control part. Therefore, the reduction of working time, workability improvement, and labor saving can be achieved. Ultimately, the improvement of productivity according to increasing of the utilization rate of the handler can be achieved. |
