发明名称 PLANAR SCANNER
摘要 FIELD: radio engineering; measuring equipment.SUBSTANCE: invention can be used in synthesis of ampli-phase metering high-precision systems intended for active phased arrays (PAA) with ultra-low side lobes, under conditions of manufacturing plant. Summary: device comprises pair of horizontal guides (1), along which along OX axis horizontal trolley (2) is moving. On support frame (11) installed on horizontal trolley (2), first vertical guide (3) is fixed, resting with its upper end on bearing strip (4). Parallel to first vertical guide (3) second and third ones are introduced installed on one straight line perpendicular to scanning region. Second and third vertical guides (3) are fixed on support frame (11) by means of straightness of guides (9) adjusting elements. Vertical carriage (5) with probe (7) connected to signal transmission circuit (8) moves along vertical guides (3). Vertical carriage (5) is installed on vertical guides (3) by means of eight supports (14) made in form of rolling bearings assemblies. Probe (7) moving mechanism consists of slide (6) and link (15). Horizontal trolley (2) and vertical carriage (5) are mechanically linked to coordinate drive (12) connected to matrix markup codes sensor (13). Further, device also comprises vertical guides adjustment system, including flatness sensor (19), buffer accumulator (20), address codes generator (21), arithmetic mean deviation computer (22), adder (24), deviation indicator (23) connected to actuating mechanism (25).EFFECT: increasing accuracy and reduced measurement time.1 cl, 2 dwg
申请公布号 RU1841123(C) 申请公布日期 2016.04.27
申请号 SU19894514244 申请日期 1989.04.04
申请人 GOSUDARSTVENNOE PREDPRIJATIE "NAUCHNO-ISSLEDOVATELSKIJ INSTITUT "KVANT" 发明人 BELEVICH ALEKSANDR VLADIMIROVICH;MARGULIS DAVID SEMENOVICH;KRAVETS ALEKSANDR MIKHAJLOVICH
分类号 G01R29/10 主分类号 G01R29/10
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