发明名称 Identifying a defect in a data-storage medium
摘要 An embodiment of a data-read path includes a defect detector and a data-recovery circuit. The defect detector is operable to identify a defective region of a data-storage medium, and the data-recovery circuit is operable to recover data from the data-storage medium in response to the defect detector. For example, such an embodiment may allow identifying a defective region of a data-storage disk caused, e.g., by a scratch or contamination, and may allow recovering data that was written to the defective region.
申请公布号 US9324370(B2) 申请公布日期 2016.04.26
申请号 US201012860653 申请日期 2010.08.20
申请人 STMICROELECTRONICS, INC. 发明人 Garani Shayan Srinivasa;Parthasarathy Sivagnanam
分类号 G11B27/36;G11B20/18;G11B20/10 主分类号 G11B27/36
代理机构 Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A. 代理人 Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
主权项 1. A data read path, comprising: a defect detector configured to identify a defective region of a data storage medium and determine a respective average power level of a plurality of read samples within each of a plurality of overlapping window regions, each window region having a same size and corresponding to a respective data storage location of the data storage medium; and a data recovery circuit configured to recover data from the data storage medium in response to the defect detector.
地址 Coppell TX US