发明名称 |
Identifying a defect in a data-storage medium |
摘要 |
An embodiment of a data-read path includes a defect detector and a data-recovery circuit. The defect detector is operable to identify a defective region of a data-storage medium, and the data-recovery circuit is operable to recover data from the data-storage medium in response to the defect detector. For example, such an embodiment may allow identifying a defective region of a data-storage disk caused, e.g., by a scratch or contamination, and may allow recovering data that was written to the defective region. |
申请公布号 |
US9324370(B2) |
申请公布日期 |
2016.04.26 |
申请号 |
US201012860653 |
申请日期 |
2010.08.20 |
申请人 |
STMICROELECTRONICS, INC. |
发明人 |
Garani Shayan Srinivasa;Parthasarathy Sivagnanam |
分类号 |
G11B27/36;G11B20/18;G11B20/10 |
主分类号 |
G11B27/36 |
代理机构 |
Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A. |
代理人 |
Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A. |
主权项 |
1. A data read path, comprising:
a defect detector configured to identify a defective region of a data storage medium and determine a respective average power level of a plurality of read samples within each of a plurality of overlapping window regions, each window region having a same size and corresponding to a respective data storage location of the data storage medium; and a data recovery circuit configured to recover data from the data storage medium in response to the defect detector. |
地址 |
Coppell TX US |