发明名称 Chemically amplified positive-type photosensitive resin composition and method for producing resist pattern using the same
摘要 A chemically amplified positive-type photosensitive resin composition including a compound represented by the following formula (1), having a melting point of 40° C. or lower at 1 atm, a resin whose solubility in alkali increases under the action of an acid, and a photoacid generator. In the formula, R1 represents a hydrogen atom or an organic group; and R2, R3, and R4 independently represent a monovalent hydrocarbon group which may have a substituent, and at least two of R2, R3, and R4 may be bonded to each other to form a cyclic structure.;
申请公布号 US9323152(B2) 申请公布日期 2016.04.26
申请号 US201414459742 申请日期 2014.08.14
申请人 TOKYO OHKA KOGYO CO., LTD 发明人 Irie Makiko
分类号 G03F7/004;G03F7/40;G03F7/039;G03F7/30;G03F7/027 主分类号 G03F7/004
代理机构 Knobbe Martens Olson and Bear, LLP 代理人 Knobbe Martens Olson and Bear, LLP
主权项 1. A chemically amplified positive-type photosensitive resin composition, comprising: a compound represented by the following formula (1), having a melting point of 40° C. or lower at 1 atm; a resin whose solubility in alkali increases under the action of an acid; and a photoacid generator, wherein in the formula (1), R1 a hydrogen atom or an unsubstituted alkyl, cycloalkyl, alkenyl, cycloalkenyl, aryl or aralkyl group R2, and R3 independently represent a monovalent hydrocarbon group which may have a substituent except a halogen atom; R4 independently represents a monovalent hydrocarbon group selected from the group consisting of a cycloalkenyl group and an aralkyl group, each of which may have a substituent.
地址 Kawasaki-Shi JP