发明名称 |
Chemically amplified positive-type photosensitive resin composition and method for producing resist pattern using the same |
摘要 |
A chemically amplified positive-type photosensitive resin composition including a compound represented by the following formula (1), having a melting point of 40° C. or lower at 1 atm, a resin whose solubility in alkali increases under the action of an acid, and a photoacid generator. In the formula, R1 represents a hydrogen atom or an organic group; and R2, R3, and R4 independently represent a monovalent hydrocarbon group which may have a substituent, and at least two of R2, R3, and R4 may be bonded to each other to form a cyclic structure.; |
申请公布号 |
US9323152(B2) |
申请公布日期 |
2016.04.26 |
申请号 |
US201414459742 |
申请日期 |
2014.08.14 |
申请人 |
TOKYO OHKA KOGYO CO., LTD |
发明人 |
Irie Makiko |
分类号 |
G03F7/004;G03F7/40;G03F7/039;G03F7/30;G03F7/027 |
主分类号 |
G03F7/004 |
代理机构 |
Knobbe Martens Olson and Bear, LLP |
代理人 |
Knobbe Martens Olson and Bear, LLP |
主权项 |
1. A chemically amplified positive-type photosensitive resin composition, comprising:
a compound represented by the following formula (1), having a melting point of 40° C. or lower at 1 atm; a resin whose solubility in alkali increases under the action of an acid; and a photoacid generator, wherein in the formula (1), R1 a hydrogen atom or an unsubstituted alkyl, cycloalkyl, alkenyl, cycloalkenyl, aryl or aralkyl group R2, and R3 independently represent a monovalent hydrocarbon group which may have a substituent except a halogen atom; R4 independently represents a monovalent hydrocarbon group selected from the group consisting of a cycloalkenyl group and an aralkyl group, each of which may have a substituent. |
地址 |
Kawasaki-Shi JP |