发明名称 Semiconductor package and method of fabricating the same
摘要 A method of fabricating a semiconductor package is provided, including: disposing a plurality of semiconductor elements on a carrier through an adhesive layer in a manner that a portion of the carrier is exposed from the adhesive layer; forming an encapsulant to encapsulate the semiconductor elements; removing the adhesive layer and the carrier to expose the semiconductor elements; and forming a build-up structure on the semiconductor elements. Since the adhesive layer is divided into a plurality of separated portions that will not affect each other due to expansion or contraction when temperature changes, the present invention prevents positional deviations of the semiconductor elements during a molding process, thereby increasing the alignment accuracy.
申请公布号 US9324585(B2) 申请公布日期 2016.04.26
申请号 US201213654754 申请日期 2012.10.18
申请人 Siliconware Precision Industries Co., Ltd. 发明人 Chang Chiang-Cheng;Lee Meng-Tsung;Huang Jung-Pang;Chiu Shih-Kuang;Huang Fu-Tang
分类号 H01L23/48;H01L23/52;H01L29/40;H01L21/56;H01L23/00;H01L23/31 主分类号 H01L23/48
代理机构 Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. 代理人 Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. ;Corless Peter F.;Jensen Steven M.
主权项 1. A semiconductor package, comprising: an encapsulant having opposite top and bottom surfaces; at least a semiconductor element embedded in the encapsulant, wherein the semiconductor element has opposite first and second surfaces and the first surface of the semiconductor element is exposed from the bottom surface of the encapsulant, wherein the first surface of the semiconductor element is on a lower level than the bottom surface of the encapsulant; a polymer layer formed between the semiconductor element and the encapsulant and extending onto the bottom surface of the encapsulant, wherein the polymer layer is formed on the second surface of the semiconductor element and the bottom surface of the encapsulant, and is free from being formed on the first surface of the semiconductor element and wherein the first surface of the semiconductor element and the polymer layer form a step structure; and a build-up structure formed on the first surface of the semiconductor element and the polymer layer on the bottom surface of the encapsulant.
地址 Taichung TW