发明名称 |
Memory access control apparatus and memory access control method |
摘要 |
A memory is readable by page and erasable by block including a plurality of pages. After a read request to the memory is issued, a memory controller specifies all blocks which can be accessed based on an address specified by a read command, as candidate blocks, and specifies an inspection target page out of pages included in the candidate blocks on the basis of a predetermined rule. The memory controller inspects whether or not there is an error in the inspection target page. |
申请公布号 |
US9323660(B2) |
申请公布日期 |
2016.04.26 |
申请号 |
US201213684823 |
申请日期 |
2012.11.26 |
申请人 |
MegaChips Corporation |
发明人 |
Tamagawa Yuko |
分类号 |
G06F12/00;G06F12/02;G06F3/06;G11C16/34 |
主分类号 |
G06F12/00 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A memory access control apparatus for controlling access to a rewritable nonvolatile semiconductor memory which is readable by page and erasable by block including a plurality of pages, comprising:
a read count memory configured to store a read count for said nonvolatile semiconductor memory by block; a specifying part configured to specify an inspection target page after a read request to said nonvolatile semiconductor memory is issued; and an inspection part configured to inspect whether there is an error in said inspection target page, wherein said specifying part includes: a candidate specifying part configured to specify all blocks which can be accessed based on an address specified by a read command, as candidate blocks; a block specifying part configured to specify a block whose read count is the highest among said candidate blocks as an inspection target block by referring to said read count memory; and a page specifying part configured to specify said inspection target page out of said inspection target block on the basis of a predetermined rule. |
地址 |
Osaka-shi JP |