发明名称 Semiconductor device structure and method for forming the same
摘要 A semiconductor device structure is provided. The semiconductor device structure includes a semiconductor substrate. The semiconductor device structure includes an isolation structure positioned in the semiconductor substrate and adjacent to a first active region of the semiconductor substrate. The semiconductor device structure includes a gate stack disposed over the first active region. The semiconductor device structure includes a first contact structure disposed over the first active region and positioned between the isolation structure and the gate stack. The semiconductor device structure includes a dummy gate stack disposed over the isolation structure and adjacent to the gate stack. The dummy gate stack is not positioned over a portion of the isolation structure next to the first contact structure.
申请公布号 US9324864(B2) 申请公布日期 2016.04.26
申请号 US201414502430 申请日期 2014.09.30
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Liang Chia-Yao;Liao Chen-Liang;Lei Ming;Chen Chih-Hsiao;Huang Yi-Lii
分类号 H01L29/76;H01L29/78;H01L29/45;H01L29/06;H01L27/088;H01L29/66;H01L21/8234 主分类号 H01L29/76
代理机构 Birch, Stewart, Kolasch & Birch, LLP 代理人 Birch, Stewart, Kolasch & Birch, LLP
主权项 1. A semiconductor device structure, comprising: a semiconductor substrate; an isolation structure positioned in the semiconductor substrate and adjacent to a first active region of the semiconductor substrate; a gate stack disposed over the first active region; a first contact structure disposed over the first active region and positioned between the gate stack and the isolation structure; and a dummy gate stack disposed over the isolation structure and adjacent to the gate stack, wherein the dummy gate stack is not positioned over a portion of the isolation structure next to the first contact structure such that only one of the dummy gate stack and the first contact structure is present in a cross-sectional view of the semiconductor device structure, and wherein the cross-sectional view of the semiconductor device structure is taken along an imaginary plane that is parallel to a normal direction of a top surface of the semiconductor substrate and perpendicular to a longitudinal direction of the gate stack.
地址 Hsin-Chu TW
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