发明名称 Integrated circuit heat dissipation using nanostructures
摘要 An approach for heat dissipation in integrated circuit devices is provided. A method includes forming an isolation layer on an electrically conductive feature of an integrated circuit device. The method also includes forming an electrically conductive layer on the isolation layer. The method additionally includes forming a plurality of nanowire structures on a surface of the electrically conductive layer.
申请公布号 US9324628(B2) 申请公布日期 2016.04.26
申请号 US201414189284 申请日期 2014.02.25
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Botula Alan B.;Lifson Max L.;Slinkman James A.;Van Kessel Theodore G.;Wolf Randy L.
分类号 H01L29/08;H01L23/373;H01L29/78;H01L29/45;H01L23/525;H01L21/02;H01L21/285;H01L23/367;B82Y10/00;H01L29/417;H01L29/06;H01L29/41 主分类号 H01L29/08
代理机构 Roberts Mlotkowski Safran & Cole, P.C. 代理人 Meyers Steven;Roberts Mlotkowski Safran & Cole, P.C.
主权项 1. A method of manufacturing a semiconductor structure, comprising: forming an isolation layer on an electrically conductive feature of an integrated circuit device, wherein the isolation layer is electrically insulating and thermally conducting; forming an electrically conductive layer on the isolation layer; and forming a plurality of nanowire structures on a surface of the electrically conductive layer, wherein the forming the plurality of nanowire structures comprises growing a plurality of spaced apart columnar structures each having a sub-micron width, wherein the growing comprises: submerging at least the electrically conductive layer in a growth solution comprising a zinc source; andapplying an electric potential between a first electrode wired to the electrically conductive layer and a second electrode submerged in the growth solution, and further comprising forming a discontinuity in a wiring path that electrically connects a contact pad to the electrically conductive layer.
地址 Armonk NY US