发明名称 |
Self-diagnosing method of a volatile memory device and an electronic device performing the same |
摘要 |
In a self-diagnosing method of a volatile memory device, a processor outputs a self-refresh entrance command and enters a power save mode, and a volatile memory device performs a self-diagnosing operation for a plurality of memory cells in response to the self-refresh entrance command while the processor is in the power save mode. |
申请公布号 |
US9324456(B2) |
申请公布日期 |
2016.04.26 |
申请号 |
US201414196453 |
申请日期 |
2014.03.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Kong Jae-Sop |
分类号 |
G06F11/00;G11C29/44;G06F11/10;G11C29/50;G11C29/52;G11C29/04 |
主分类号 |
G06F11/00 |
代理机构 |
F. Chau & Associates, LLC |
代理人 |
F. Chau & Associates, LLC |
主权项 |
1. A self-diagnosing method of a volatile memory device, the self-diagnosing method comprising:
outputting, from a processor, a self-refresh entrance command and entering a power save mode; and performing, at a volatile memory device, a self-diagnosing operation for a plurality of memory cells in response to the self-refresh entrance command while the processor is in the power save mode, wherein the self-diagnosing operation includes identifying a position of a memory cell with a short data retention time. |
地址 |
Suwon-Si, Gyeonggi-Do KR |