发明名称 Self-diagnosing method of a volatile memory device and an electronic device performing the same
摘要 In a self-diagnosing method of a volatile memory device, a processor outputs a self-refresh entrance command and enters a power save mode, and a volatile memory device performs a self-diagnosing operation for a plurality of memory cells in response to the self-refresh entrance command while the processor is in the power save mode.
申请公布号 US9324456(B2) 申请公布日期 2016.04.26
申请号 US201414196453 申请日期 2014.03.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Kong Jae-Sop
分类号 G06F11/00;G11C29/44;G06F11/10;G11C29/50;G11C29/52;G11C29/04 主分类号 G06F11/00
代理机构 F. Chau & Associates, LLC 代理人 F. Chau & Associates, LLC
主权项 1. A self-diagnosing method of a volatile memory device, the self-diagnosing method comprising: outputting, from a processor, a self-refresh entrance command and entering a power save mode; and performing, at a volatile memory device, a self-diagnosing operation for a plurality of memory cells in response to the self-refresh entrance command while the processor is in the power save mode, wherein the self-diagnosing operation includes identifying a position of a memory cell with a short data retention time.
地址 Suwon-Si, Gyeonggi-Do KR