| 发明名称 | Stacked semiconductor apparatus and semiconductor system capable of inputting signals through various paths | ||
| 摘要 | A semiconductor apparatus includes a control signal reception portion. The control signal reception portion may set information related to operation of a memory chip by receiving a command signal and an address signal from one among a stack chip test portion, a control signal interface portion and a test setting portion. | ||
| 申请公布号 | US9324380(B2) | 申请公布日期 | 2016.04.26 |
| 申请号 | US201414329213 | 申请日期 | 2014.07.11 |
| 申请人 | SK HYNIX INC. | 发明人 | Byeon Sang Jin;Ko Jae Bum;Ku Young Jun |
| 分类号 | G11C5/04;G11C29/12;G11C29/26;H01L25/18;H01L23/00;H01L25/065;G11C29/18;G11C7/10 | 主分类号 | G11C5/04 |
| 代理机构 | William Park & Associates Ltd. | 代理人 | William Park & Associates Ltd. |
| 主权项 | 1. A semiconductor apparatus comprising: a control signal reception portion suitable for setting information related to operation of a memory chip by receiving a command signal and an address signal from one among a stack chip test portion, a control signal interface portion and a test setting portion in response to an input path selection signal, wherein the test setting portion receives the command signal and the address signal from the control signal interface portion, and the command signal and the address signal for setting information related to operation of the memory chip are provided from the test setting portion when the command signal and the address signal for a normal operation of the memory chip are provided from the control signal interface portion. | ||
| 地址 | Icheon-Si KR | ||