Semiconductor device, physical quantity sensor, electronic apparatus, and moving object

摘要

A semiconductor device includes a digital circuit having a scan test mode. The digital circuit includes a first flip-flop forming a part of a scan chain when in the scan test mode, and a first selector provided on an input side of the first flip-flop. The first selector is capable of selecting a first signal when not in the scan test mode, and selecting a second signal that is different from the first signal when in the scan test mode.

主权项

1. A semiconductor device comprising:
a digital circuit having a scan test mode and a normal operation mode different from the scan test mode; and an analog circuit having an interface with the digital circuit, wherein: the digital circuit includes:
a first flip-flop that forms a part of a scan chain when in the scan test mode,a first selector provided on an input side of the first flip-flop and capable of selecting a first signal when in the normal operation mode, and capable of selecting a second signal that is different from the first signal when in the scan test mode,a second flip-flop that forms a part of the scan chain when in the scan test mode, anda first logic element provided in a signal path extending from and between an output of the first selector to an input of the first flip-flop, further wherein: the first signal is an input signal to the digital circuit from the analog circuit, and the second signal is an output signal from the second flip-flop.