Test circuit and method of semiconductor integrated circuit

摘要

A test circuit of a semiconductor integrated circuit includes a through via, a voltage driving unit, and a determination unit. The through via is charged by receiving an input voltage. The voltage driving unit generates a test voltage by charging or discharging the through via in response to a test control signal. The determination unit compares levels of the input voltage and the test voltage and outputs a resultant signal.

主权项

1. A test circuit of a semiconductor integrated circuit, comprising:
a through via configured to be charged by receiving an input voltage; a voltage driving unit configured to generate a test voltage by supplying an additional charge to the charged through via using an external voltage or discharging the charged through via using a ground voltage in response to a test control signal; and a determination unit configured to compare levels of the input voltage and the test voltage and output a resultant signal based on the comparison of the levels of the input voltage and the test voltage.