发明名称 基板処理装置
摘要 Provided is a substrate processing including: a plasma generation source configured to generate the plasma within the processing container; a substrate holding mechanism configured to hold the substrate within the processing container; a separation plate disposed between the plasma generation source and the substrate holding mechanism and having a plurality of openings formed therein, in which the plurality of openings are configured to neutralize the plasma generated in the plasma generation source so as to form neutral particles, and to irradiate the neutral particles onto the substrate; and a directivity adjusting mechanism configured to adjust directivity of the neutral particles irradiated onto the substrate such that a plurality of peak values of an incident angle distribution of the neutral particles on the substrate are distributed at positions which are deviated from a normal direction of the substrate and located on both sides of the normal direction.
申请公布号 JP5908001(B2) 申请公布日期 2016.04.26
申请号 JP20140005782 申请日期 2014.01.16
申请人 東京エレクトロン株式会社;株式会社 東北テクノアーチ 发明人 石橋 清隆;菊地 良幸;寒川 誠二
分类号 C23C16/455;C23C16/511;H01L21/205;H01L21/3065;H01L21/31;H05H1/46;H05H3/00 主分类号 C23C16/455
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