发明名称 半導体モジュール、及び半導体モジュールの製造方法
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which allows each semiconductor element to obtain sufficient bonding strength by reducing pressurization unevenness between semiconductor elements even when a plurality of semiconductor elements are heated and pressurized.SOLUTION: A semiconductor device comprises: a first semiconductor element 120; a second semiconductor element 110 thicker than the first semiconductor element; and an insulating substrate 140 provided with a wiring layer 130. The first semiconductor element and the wiring layer 130 are bonded via a first sintered layer 121 sintered using a silver powder. The second semiconductor element and the wiring layer 130 are bonded via a second sintered layer 111 sintered using a sintered metal having a larger volume contraction rate than the silver powder.
申请公布号 JP5907861(B2) 申请公布日期 2016.04.26
申请号 JP20120281945 申请日期 2012.12.26
申请人 株式会社 日立パワーデバイス 发明人 保田 雄亮;床尾 尚也;守田 俊章
分类号 H01L23/40;B22F1/00;B22F3/22;B22F7/08;H01L25/07;H01L25/18 主分类号 H01L23/40
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