发明名称 Three-dimensional vertical gate NAND flash memory including dual-polarity source pads
摘要 A memory includes a three-dimensional array including a plurality of levels is described. Each level includes a bit line pad, a source line pad, and a plurality of strips of semiconductor material extending between the bit line pad and the source line pad. The source line pad includes at least one n-type region and at least one p-type region. The memory includes word lines coupled to the plurality of strips in the plurality of levels. The memory includes data storage elements between the word lines and the strips of semiconductor material, whereby memory cells are disposed at cross-points of the strips and the word lines. The memory also includes circuitry coupled to the n-type region and the p-type region of the source line pad, configured to selectively enable current flow in the strips extending from the source line pad and one of the n-type region and the p-type region.
申请公布号 US9324728(B2) 申请公布日期 2016.04.26
申请号 US201414324842 申请日期 2014.07.07
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 Hu Chih-Wei;Yeh Teng-Hao
分类号 H01L27/115;G11C16/06;G11C16/04 主分类号 H01L27/115
代理机构 Haynes Beffel & Wolfeld LLP 代理人 Haynes Beffel & Wolfeld LLP
主权项 1. A memory comprising: a strip of semiconductor material extending between a bit line pad and a source line pad, the source line pad including at least one n-type region and at least one p-type region; a gate coupled to the strip; a data storage element between the gate and the strip, whereby a memory cell is disposed at a cross-point of the strip and the gate; and circuitry coupled to the n-type region and the p-type region of the source line pad, configured to selectively enable current flow in the strip through one of the n-type region and the p-type region.
地址 Hsinchu TW