发明名称 METHOD FOR MANUFACTURING SINGLE CRYSTAL SiC WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a single crystal SiC wafer, capable of corresponding to an increase in diameter and obtaining a single crystal SiC wafer high in crystallinity.SOLUTION: The method for manufacturing a single crystal SiC wafer comprises: the first step of epitaxially growing a single crystal SiC layer on a silicon wafer; and the second step of removing the silicon wafer to obtain the single crystal SiC wafer consisting of the single crystal SiC layer. The first step comprises: ionizing a raw material gas including carbon and silicon while maintaining the temperature of the silicon wafer at a temperature of less than the melting point of silicon; and accelerating the ions to irradiate the silicon wafer.SELECTED DRAWING: Figure 1
申请公布号 JP2016060688(A) 申请公布日期 2016.04.25
申请号 JP20140192694 申请日期 2014.09.22
申请人 SUMCO CORP 发明人 KOGA YOSHIYASU
分类号 C30B29/36;C30B23/08 主分类号 C30B29/36
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