| 摘要 |
PROBLEM TO BE SOLVED: To provide an electrical contact for use in an integrated circuit testing apparatus, the electrical contact having a very short rigid contact pin with a short wiping stroke.SOLUTION: The electrical contact for use in an integrated circuit testing apparatus is provided with a very short conducting contact pin 10. Since the contact pin is short, the contact pin is coupled with an elastomer 20 and supported by a housing 30 together with the elastomer in such a way that the contact pin test height is brought down to 0.5 mm, with a deflection of 0.1 mm. This enables appropriate contact even with tin plated devices. The contact pin looks almost like the letter "F"; when used, it is rotated 90° to the left, so that it lies on its left side. In addition, a rectangular shaped elastomer is placed between the prongs of the "F". Further, the bottom part of the "F" is curved upwards so that it is almost parallel to the prongs.SELECTED DRAWING: Figure 1 |
