| 摘要 |
PROBLEM TO BE SOLVED: To provide a source driver IC that applies a voltage stress to a gradation voltage line and performs a stress test reliably in a short time.SOLUTION: The source driver IC has: a gradation voltage generation circuit for generating j pieces of gradation voltages (j is an integer equal to or greater than 2); a decoder circuit for selecting a drive voltage corresponding to n pieces of data from the j pieces of gradation voltages on the basis of an inputted gradation signal and outputting the selected drive voltage; and a gradation voltage line group juxtaposed in a wiring layer and comprising j pieces of gradation voltage lines for transmitting each of the j gradation voltages to the decoder circuit. The gradation voltage line group is arranged so that gradation voltage lines for transmitting gradation voltages indicating (k+j/2) gradation levels are disposed adjacent to gradation voltage lines for transmitting gradation voltages indicating k gradation levels (k is an integer satisfying the relationship 0≤k<j/2), and gradation voltage lines for transmitting gradation voltages indicating (k+1) gradation levels are disposed adjacent to gradation voltage lines for transmitting gradation voltages indicating (k+j/2) gradation levels.SELECTED DRAWING: Figure 4 |
