发明名称 |
GATE CONTROL DEVICE, SEMICONDUCTOR DEVICE, AND METHOD OF CONTROLLING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a gate control device capable of shortening a switching time of a junction field effect transistor.SOLUTION: A semiconductor device according to an embodiment has a source electrode, a drain electrode, and a gate electrode. A gate voltage to be applied to a gate electrode of a junction field effect transistor having a first threshold at which the transistor becomes in an on state and a second threshold at which conductivity modulation occurs at the transistor, is controlled to be the second threshold or more when a forward current in a direction from the drain electrode toward the source electrode is applied, and controlled so as to have a point where a time change rate of the gate voltage is changed to be decreased at a voltage between the second threshold and the first threshold when the forward current is blocked.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016063498(A) |
申请公布日期 |
2016.04.25 |
申请号 |
JP20140192014 |
申请日期 |
2014.09.19 |
申请人 |
TOSHIBA CORP |
发明人 |
IKEDA KENTARO;KURAGUCHI MASAHIKO |
分类号 |
H03K17/04;H01L21/337;H01L21/338;H01L27/098;H01L29/778;H01L29/808;H01L29/812;H02M1/08;H03K17/695 |
主分类号 |
H03K17/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|