| 摘要 |
PROBLEM TO BE SOLVED: To provide a test device capable of shortening a calibration time, and a calibration method therefor.SOLUTION: A test device 1 includes: a signal generation part 20 which generates a signal; a signal receiving part 23 which receives a signal from a device to be tested; a transmission FE part 30 for selecting any one of one or more amplifier paths including an amplifier and any one of one or more through paths not including the amplifier; a transmission FELB switching part 31 connected either to a loopback path 3a for looping an input signal back to a side of the signal receiving part 23 or to an output terminal 37; a reception FELB switching part 34 for outputting a signal from the transmission FELB switching part 31 or an input terminal 38 to the signal receiving part 23; and a correction value calculation part which calculates a correction value for calibrating a loss of each path included in the transmission FE part 30 on the basis of a signal level that is received by the signal receiving part 23 via the loopback path 3a in the state where a signal level of the output terminal 37 is a transmission reference level of calibration.SELECTED DRAWING: Figure 2 |
