发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To suppress deterioration in reliability of a semiconductor device.SOLUTION: A semiconductor device includes: a chip laminate having a plurality of laminated semiconductor chips; a sealing resin layer for sealing the chip laminate; a first bump layer provided on the chip laminate so as to be buried in the sealing resin layer and having a flat surface exposed from the sealing resin layer along an upper surface of the sealing resin layer; and a second bump layer provided on the flat surface of the first bump layer.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016062995(A) |
申请公布日期 |
2016.04.25 |
申请号 |
JP20140188173 |
申请日期 |
2014.09.16 |
申请人 |
TOSHIBA CORP |
发明人 |
SATO TAKAO |
分类号 |
H01L25/065;H01L21/60;H01L23/12;H01L25/07;H01L25/18 |
主分类号 |
H01L25/065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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