发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress deterioration in reliability of a semiconductor device.SOLUTION: A semiconductor device includes: a chip laminate having a plurality of laminated semiconductor chips; a sealing resin layer for sealing the chip laminate; a first bump layer provided on the chip laminate so as to be buried in the sealing resin layer and having a flat surface exposed from the sealing resin layer along an upper surface of the sealing resin layer; and a second bump layer provided on the flat surface of the first bump layer.SELECTED DRAWING: Figure 1
申请公布号 JP2016062995(A) 申请公布日期 2016.04.25
申请号 JP20140188173 申请日期 2014.09.16
申请人 TOSHIBA CORP 发明人 SATO TAKAO
分类号 H01L25/065;H01L21/60;H01L23/12;H01L25/07;H01L25/18 主分类号 H01L25/065
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