发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing deterioration in transistors constituting a word line driver.SOLUTION: A word line driver circuit includes: a first transistor P04 having a source-drain path between a first power supply line VPP and a first word line MWL80; a second transistor N04 having a source-drain path between the first word line MWL80 and a first circuit node A03; a third transistor 55 having a source-drain path between the first power supply line VPP and a second circuit node; a fourth transistor 56 having a source-drain path between the second circuit node and the first circuit node A03; and a fifth transistor 54 having a source-drain path between the first circuit node A03 and a second power supply line VSS. Even when a high-level signal is supplied to a wiring RF3, the first circuit node A03 is precharged to VPP-Vt, thereby avoiding hot carrier deterioration of the second transistor N04.SELECTED DRAWING: Figure 6
申请公布号 JP2016062625(A) 申请公布日期 2016.04.25
申请号 JP20140188618 申请日期 2014.09.17
申请人 MICRON TECHNOLOGY INC 发明人 FUJIMITSU MORIMICHI;NOGUCHI HIDEKAZU
分类号 G11C11/407 主分类号 G11C11/407
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