发明名称 METHOD OF FABRICATING ELECTROSTATICALLY ENHANCED FINS AND STACKED NANOWIRE FIELD EFFECT TRANSISTORS
摘要 Non-planar semiconductor devices including semiconductor fins or stacked semiconductor nanowires that are electrostatically enhanced are provided. The electrostatic enhancement is achieved in the present application by epitaxially growing a semiconductor material protruding portion on exposed sidewalls of alternating semiconductor material portions of at least one hard mask capped semiconductor-containing fin structure that is formed on a substrate.
申请公布号 US2016111544(A1) 申请公布日期 2016.04.21
申请号 US201514979195 申请日期 2015.12.22
申请人 International Business Machines Corporation 发明人 Cheng Kangguo;Doris Bruce B.;Hashemi Pouya;Khakifirooz Ali;Reznicek Alexander
分类号 H01L29/78;H01L21/02;H01L29/06;H01L21/308;H01L29/66 主分类号 H01L29/78
代理机构 代理人
主权项 1. A method of forming a semiconductor structure comprising: providing a semiconductor-containing fin structure on a surface of a base layer, wherein said semiconductor-containing fin structure comprises, from bottom to top, and in an alternating manner, at least one first semiconductor material portion having a first oxidation rate, and at least one second semiconductor material portion having a second oxidation rate, wherein said first oxidation rate is slower than the second oxidation rate; performing an oxidation process to form an oxide liner portion on each of said first semiconductor material portions and to completely convert each of said second semiconductor material portions into an oxide structure; completely removing said first oxide liner portion from each of said first semiconductor material portions and each of said oxide structures; and epitaxially growing a semiconductor material protruding portion from an exposed semiconductor sidewall surface of each of said first semiconductor material portions.
地址 Armonk NY US