发明名称 DEFECT INFORMATION SPECIFYING DEVICE AND DEFECT INFORMATION SPECIFYING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a defect information specifying device and a defect information specifying method capable of automatically specifying the defect information of a given printed matter among a plurality of pieces of defect information.SOLUTION: The defect information specifying device includes an image acquisition part 407 for acquiring a first read image resulted from electronically reading a given printed matter, a defect information acquisition part 413 for acquiring one or more pieces of defect information including a second read image resulted from electronically reading the printed matter and area information indicating the area of a defect present on the second read image, a collation part 417 for extracting, for each defect information, a second area image including an area on the second read image indicated by the area information from the second read image to collate it with a first area image including an area on the first read image corresponding to the area on the second read image indicated by the area information, and a specifying part 419 for specifying, when it is verified that an image corresponding to the second area image is present in the first area image, defect information having the second read image resulted from extracting the second area image to be the defect information of the given printed matter.SELECTED DRAWING: Figure 7
申请公布号 JP2016055525(A) 申请公布日期 2016.04.21
申请号 JP20140183621 申请日期 2014.09.09
申请人 RICOH CO LTD 发明人 FUKASE TAKAHIRO
分类号 B41J29/46;G01N21/88;G01N21/95;G06T1/00 主分类号 B41J29/46
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