发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 It is an object to provide an oxide semiconductor which is suitable for use in a semiconductor device. Alternatively, it is another object to provide a semiconductor device using the oxide semiconductor. Provided is a semiconductor device including an In—Ga—Zn—O based oxide semiconductor layer in a channel formation region of a transistor. In the semiconductor device, the In—Ga—Zn—O based oxide semiconductor layer has a structure in which crystal grains represented by InGaO3(ZnO)m (m=1) are included in an amorphous structure represented by InGaO3(ZnO)m (m>0).
申请公布号 US2016111282(A1) 申请公布日期 2016.04.21
申请号 US201514972964 申请日期 2015.12.17
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 AKIMOTO Kengo;SAKATA Junichiro;HIROHASHI Takuya;TAKAHASHI Masahiro;KISHIDA Hideyuki;MIYANAGA Akiharu
分类号 H01L21/02;H01L21/28;H01L29/66 主分类号 H01L21/02
代理机构 代理人
主权项 1. (canceled)
地址 Atsugi-shi JP