发明名称 PLASMA PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing apparatus or processing method that is improved in yield of processing.SOLUTION: A plasma processing method includes: a first process of arranging a wafer to be processed in a pressure-reduced processing chamber in a vacuum container, and discharging a reactive gas left in the processing chamber while stopping supplying the reactive gas; a third process of generating plasma in the processing chamber by introducing an inert gas into the processing chamber and desorbing reaction products between an adsorption layer and the film to be processed using particles in the plasma and vacuum ultraviolet light generated from the plasma; and a fourth process of discharging the reaction products from inside the processing chamber while no plasma is being generated.SELECTED DRAWING: Figure 4
申请公布号 JP2016058590(A) 申请公布日期 2016.04.21
申请号 JP20140184745 申请日期 2014.09.11
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 MATSUI MIYAKO;YOKOGAWA KENETSU;KANEKIYO TOKIMITSU;ONO TETSUO;SHINODA KAZUNORI
分类号 H01L21/3065;H05H1/46 主分类号 H01L21/3065
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