| 摘要 |
A pattern of features of a storage medium includes first features having a first logical state and second features having a second logical state, wherein a cross track dimension of the first features is different from a cross track dimension of the second features. A transducer of a memory device senses the pattern of features and generates a transducer signal. Read circuitry samples the transducer signal at a frequency of a sampling clock signal and generates a read signal from the sampled transducer signal. Servo electronics includes a demodulator that demodulates at least first and second orthogonal frequency components of the read signal. Timing circuitry synchronizes a phase of the sampling clock signal with a phase of the pattern of features using the first orthogonal frequency component. Position error circuitry generates a signal indicating a cross track positional offset of the transducer relative to the features using the first and second orthogonal frequency components. |
