发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory having high reliability.SOLUTION: A semiconductor memory includes first and second select gates of one end side of a memory unit. A first select gate transistor SGCT has a channel region CRa in a semiconductor substrate 700, a channel region CRb in a semiconductor pillar 75 and a gate electrode 73 connected to a first select gate line SGC. A second select gate transistor SGST has a channel region in the semiconductor pillar 75 and a gate electrode 72 connected to a second select gate line SGS. The first select gate line SGC is connected to a first voltage circuit 220, and the second select gate SGS is connected to a second voltage circuit 440.SELECTED DRAWING: Figure 4
申请公布号 JP2016058118(A) 申请公布日期 2016.04.21
申请号 JP20140184198 申请日期 2014.09.10
申请人 TOSHIBA CORP 发明人 HASHIMOTO TOSHIFUMI
分类号 G11C16/02;G11C16/04;H01L21/336;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 G11C16/02
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