发明名称 |
Test Point Insertion For Low Test Pattern Counts |
摘要 |
Various aspects of the disclosed technology relate to conflict-reducing test point insertion techniques. Locations in a circuit design for inserting test points are determined based on internal signal conflicts caused by detecting multiple faults with a single test pattern. Test points are then inserted at the locations. The internal signal conflicts may comprise horizontal conflicts, vertical conflicts, or both. The test points may comprise control points, observation points, or both. |
申请公布号 |
US2016109517(A1) |
申请公布日期 |
2016.04.21 |
申请号 |
US201514884611 |
申请日期 |
2015.10.15 |
申请人 |
Mentor Graphics Corporation |
发明人 |
Rajski Janusz;Moghaddam Elham K.;Mukherjee Nilanjan;Tyszer Jerzy;Zawada Justyna |
分类号 |
G01R31/3177 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
|
主权项 |
1. A method, executed by at least one processor of a computer, comprising:
determining locations in a circuit design for inserting test points based on internal signal conflicts caused by detecting multiple faults with a single test pattern; inserting test points at the locations. |
地址 |
Wilsonville OR US |