发明名称 OPTICAL ROUTE EXAMINATION SYSTEM AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide an optical route examination system and method for examining routes traveled by vehicles and/or equipment disposed alongside the routes.SOLUTION: Optical route examination systems 100 and methods obtain image data of a field of view of a camera 106 (106a, 106b) disposed onboard a vehicle 102 as the vehicle 102 moves along a route 120, and autonomously examine the image data onboard the vehicle 102 to identify one or more of a feature of interest and a designated object. The feature of interest includes a standard gauge distance between two or more portions of the first route, and the designated object includes a sign and wayside equipment.SELECTED DRAWING: Figure 1
申请公布号 JP2016058086(A) 申请公布日期 2016.04.21
申请号 JP20150173383 申请日期 2015.09.03
申请人 GENERAL ELECTRIC CO <GE> 发明人 NIDHI NAITHANI;DATTARAJ JAGDISH RAO;SCOTT DANIEL NELSON;NIKHIL UDAY NAPHADE
分类号 G06T7/00;B61K9/08 主分类号 G06T7/00
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