发明名称 |
ELECTROSTATIC LENS HAVING A DIELECTRIC SEMICONDUCTING MEMBRANE |
摘要 |
Electrostatic lenses for focusing a beam of charged particles, and in particular an electron beam, are used especially in the electron guns of electron microscopes or electron-beam lithography apparatuses. The present disclosure improves the possibilities for focusing the particle beam, in particular an electron beam emitted by a cathode. The lens comprises at least one conducting electrode having at least one through-opening for the passage of an electron beam. Different electric fields are set up upstream and downstream of the opening. The passage opening is at least partially closed by a planar or curved thin membrane of semi-conducting material that is transparent to electrons and has a high dielectric permittivity. Structuring the membrane (holes or thickened portions of electrodes deposited on the membrane) makes it possible to correct lens aberration defects. |
申请公布号 |
US2016111244(A1) |
申请公布日期 |
2016.04.21 |
申请号 |
US201414894800 |
申请日期 |
2014.05.26 |
申请人 |
CONSTANCIAS Christophe;COMMISSARIAT A L 'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
发明人 |
CONSTANCIAS Christophe |
分类号 |
H01J37/12 |
主分类号 |
H01J37/12 |
代理机构 |
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代理人 |
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主权项 |
1. An electrostatic lens provided with at least one conductive electrode pierced with at least one aperture for passing an electron beam, wherein the passing aperture is closed at least partially by a thin membrane (M) of a non-degenerate semiconductor that is transparent to the electrons of the beam and of relative dielectric permittivity higher than 10. |
地址 |
Sarcenas FR |