发明名称 SPECTROSCOPIC MEASUREMENT METHOD AND SPECTROSCOPIC MEASUREMENT DEVICE
摘要 In a spectroscopic measurement method, measurement light from a light source is irradiated onto an object of measurement, transmitted or diffusely reflected light emitted from the object of measurement as a result of the irradiation of the measurement light is received by a plurality of two-dimensionally arranged pixels, spectral data is acquired for a plurality of unit regions including at least one unit region on the object of measurement and a unit region adjacent to the one unit region, and spectral data for the object of measurement is calculated through the averaging of the spectral data for each of the plurality of unit regions. Further, a spectral measurement device images the same unit region of the object of measurement a plurality of times (two or more times) and calculates spectral data for the object of measurement by integrating and averaging the spectral data obtained from the unit regions of the object of measurement imaged a plurality of times.
申请公布号 WO2016059946(A1) 申请公布日期 2016.04.21
申请号 WO2015JP76819 申请日期 2015.09.21
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 OKUNO, TOSHIAKI;MORISHIMA, TETSU;FUJIMOTO, MIYOKO
分类号 G01J3/50;G01N21/359 主分类号 G01J3/50
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