发明名称 RESIST COMPOSITION AND PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a resist composition having excellent performance in characteristics such as dissolution contrast, MEF performance and dimensional stability performance in organic solvent development, a pattern forming method using the resist composition, and a polymeric compound.SOLUTION: The resist composition comprises a polymeric compound having a repeating unit represented by general formula (1) and at least one of repeating units represented by general formulae (2A), (2B) or (2C).SELECTED DRAWING: Figure 1
申请公布号 JP2016057614(A) 申请公布日期 2016.04.21
申请号 JP20150162487 申请日期 2015.08.20
申请人 SHIN ETSU CHEM CO LTD 发明人 FUJIWARA NORIYUKI;SAGEHASHI MASAYOSHI;HASEGAWA KOJI;OIKAWA KENICHI
分类号 G03F7/039;C08F220/28;G03F7/004;G03F7/038;G03F7/20;G03F7/32 主分类号 G03F7/039
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