发明名称 MATRIX DEVICE, AND CHARACTERISTIC MEASUREMENT METHOD AND DRIVE METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a characteristic measurement method of an electric element which is a factor of variation of luminance among pixels.SOLUTION: A matrix device comprises components (pixels) arranged in a matrix state, and a wiring. The respective components can supply current with an electric element included in the respective components, to the wiring. In N components capable of supplying current to the wiring, respective orientations of current of the N components are individually set, and current flowing on the wiring is measured N times. The orientation of current flowing on the electric element can be changed. In each of N times measurement, a combination of the current orientations of the N components is different. Based on the obtained current by N times measurement, and the combination of the current orientation of the N times measurement, magnitude of current flowing respective electric element is calculated.SELECTED DRAWING: Figure 3
申请公布号 JP2016057623(A) 申请公布日期 2016.04.21
申请号 JP20150174936 申请日期 2015.09.04
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MIYAKE HIROYUKI
分类号 G09G3/30;G09G3/20;H04N5/365;H04N5/369;H04N5/374;H04N5/3745;H04N17/04 主分类号 G09G3/30
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