发明名称 FILM STRESS UNIFORMITY CONTROL BY RF COUPLING AND WAFER MOUNT WITH ADAPTED RF COUPLING
摘要 A fixture or clamp for a wafer in a vacuum treatment system comprises a non-conductive body with a first plane surface for arranging a substrate (wafer) thereon and a second surface opposite to said first surface. Said body includes a plurality of electrode-pairs; each electrode pair comprising a first electrode with a first electrode surface and a second electrode with a second electrode surface, said electrode surfaces interconnected via a conductive means and arranged essentially in parallel to said first and second surface, said first electrode located closer to said first surface than said second electrode and said second, electrode located closer to said second surface than said first electrode. Such a body influences can be used the RF coupling between wafer and pedestal on RF potential to achieve a uniform film stress profile/distribution during film deposition or other substrate treatment.
申请公布号 WO2016059045(A1) 申请公布日期 2016.04.21
申请号 WO2015EP73667 申请日期 2015.10.13
申请人 EVATEC AG 发明人 BALON, FRANTISEK
分类号 H01L21/683 主分类号 H01L21/683
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