| 摘要 |
A photoresponsive element 14 such as a solar cell is tested by passing light from a broadband solar simulator source 11 through an interferometer 12 such that a varying interference pattern is incident on the element and measuring the signal from the element. The spectral response of the element may be computed by transforming the time domain signal from the element to the frequency domain by FFT. A current density voltage (J-V) characteristic of the element may be determined by measuring the offset (40, Fig 2a) of the signal, and a J-V curve determined by applying and varying a bias voltage. The light transmitted and reflected by the element may be measured by detectors 31, 32. The spectrum of the source light may also be measured by detector 33 as a reference channel to help determine the efficiency of the element. The interference pattern on the element may be varied by moving a mirror 22 on one arm of a Michelson interferometer. |
