发明名称 MASK AND ITS MANUFACTURING METHOD, EXPOSURE, AND SEMICONDUCTOR DEVICE FABRICATION METHOD
摘要 A mask arranges a predetermined pattern and an auxiliary pattern smaller than the predetermined pattern so that where a virtual lattice is assumed which has a lattice point located at a center of the predetermined pattern, a center of the auxiliary pattern is offset from the lattice point of the virtual lattice.
申请公布号 EP1450206(B1) 申请公布日期 2016.04.20
申请号 EP20040003772 申请日期 2004.02.19
申请人 CANON KABUSHIKI KAISHA 发明人 YAMAZOE, KENJI;SAITOH, KENJI;SUZUKI, AKIYOSHI
分类号 G03F1/36;H01L21/027;G03F1/00 主分类号 G03F1/36
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